Rules for Classification and Construction Additional Rules and Guidelines

Transcription

1 VI Rules for Classification and Construction Additional Rules and Guidelines 7 Guidelines for the Performance of Type Approvals 7 Test Requirements for Statical Converters with Semi-Conductors Edition 1999

2 The following Guidelines come into force on September 1 st, "General Terms and Conditions" of the respective latest edition will be applicable (see Rules for Classification and Construction, I Ship Technology, Part 0 Classification and Surveys) Reproduction by printing or photostatic means is only permissible with the consent of Germanischer Lloyd. Germanischer Lloyd AG Head Office Vorsetzen 35, Hamburg / Germany Telefon Telefax headoffice@gl-group.com Published by: Germanischer Lloyd AG, Hamburg Printed by: Gebrüder Braasch GmbH, Hamburg

3 VI - Part 7 Table of Contents Chapter 6 Page 3 Table of Contents Section 1 General Conditions A. Scope B. References to other Regulations and Rules C. Mandatory Type Testing D. Submission of Documents Section 2 Requirements Related to Products A. General B. Environmental Categories Section 3 Test Requirements A. General B. Tests Annex A Required Tests (Summary)

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5 VI - Part 7 Section 1 D General Conditions Chapter 7 Page 1 1 Section 1 General Conditions A. Scope These regulations apply to the type testing of static converters with semiconductors, such as line and self commutated static frequency converters, power converters, power amplifiers etc. B. References to other Regulations and Rules 1. In addition to the regulations listed under point 2, below, the following publications of Germanischer Lloyd shall also apply: Rules for Classification and Construction, I - Ship Technology Part 1 - Seagoing Ships, Chapter 3 Electrical Installations Regulations for the Performance of Type Tests, Part 0, Procedure Regulations for the Performance of Type Tests, Part 1, Test Requirements for Electrical/Electronic Equipment, Computers and Peripherals 2. Reference is made to the following IEC Publications: IEC Electrical Installation in Ships, Part 304 (Semiconductor Converters) IEC Electrical Installation in Ships, Part 504 (Special features - Control and Instrumentation) IEC Semiconductor Power Converters IEC Adjustable speed electrical power drive systems IEC Electromagnetic compatibility of electrical and electronic installations in ships. 3. Standards other than those listed under point 2, above, may be accepted provided that they are equivalent. C. Mandatory Type Testing Semiconductor static converters are subject to mandatory type testing where these involve standardised switchgear units manufactured in series with reduced clearance and creepage distances, open- and closed loop controls for speed and output of internal combustion engines (mainand auxiliary engines, and electrical actuators or any other applications as described in the Rules for Classification and Construction, I - Ship Technology Part 1 - Seagoing Ships, Chapter 3, Electrical Installations, Section 18, Paragraph E. On request a type test may also be performed on semiconductor static converters which are not subject to mandatory type testing. D. Submission of Documents The following documents have to be submitted: 1. Product specification together with full performance description, technical data and operating conditions 2. Relevant design documents containing information about the used materials and projection-, assembly- and general arrangement drawings 3. Detailed equipment description explaining the principle of operation, along with block diagrams, operating and servicing instructions, a description of the self-monitoring facilities and fault handling procedures 4. List of associated standards and regulations 5. Test reports together with test records and certificates related to tests which have already been performed 6. Wiring diagrams

6 Chapter 7 Page 1 2 Section 1 D General Conditions VI - Part 7 7. Parts lists with denomination of components, types and manufacturers, particularly those of power semiconductors, fuses, chokes, transformers, filter circuits and cooling facilities 8. Description of the quality management system or the QM certificate 9. The works test programmes specified in the quality management system The reserves the right to ask for further documents in individual cases.

7 VI - Part 7 Section 2 B Requirements Related to Products Chapter 7 Page 2 1 Section 2 Requirements Related to Products A. General The requirements for static converters with semiconductors regarding to design, function and conditions of use are laid down in the relevant Classification Rules and other associated regulations. category A (general application) or C (increased thermal stress, e.g. relating to equipment which is installed in consoles and housings). Table 2.1 Ambient conditions B. Environmental Categories The environmental categories specified in the Regulations for Type Tests, Part 1, Section 2, Paragraph B shall apply. General semiconductor static converters are likely to fall within the environmental Environmental categories Temperature Relative humidity Vibration A 0 to 45 C up to 100 % 0,7 g C 0 to 55 C up to 100 % 0,7 g

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9 VI - Part 7 Section 3 B Test Requirements Chapter 7 Page 3 1 Section 3 Test Requirements A. General 1. Selection of Test Specimen Test specimen from serial produced equipment must be selected from the current production. The choice of equipment for testing shall be agreed with. Where the test samples are prototypes the reserves the right to perform comparative tests on serial produced equipment at a later date. Representative samples from a line of products may be selected for type tests. 2. Scope of Tests The scope of the tests is specified by the on a case by case basis depending upon the product type and use. reserves the right to request that additional tests shall be performed in justified cases. 3. Test Sequence The test sequence must be specified by the manufacturer prior to start of testing and agreed with. All tests specified for an equipment shall be carried out on the same specimen. Deviations from this procedure are subject to authorisation. 4. Documentation of Tests The tests performed and its results shall be comprehensively documented in test records including details of the used measurement- and test equipment, the ambient conditions and the test methods applied (see: Part 0, Procedure, Section 3, G). B. Tests 1. Visual Inspection The test sample shall be checked for conformity with: the Rules for Classification and Construction and also the Regulations the manufacturer s specification the design drawings the specified standards This inspection includes an evaluation of the mechanical composition of the test piece with regard to: compliance with the specified degree of protection (Note: where appropriate a test shall be performed to prove the degree of protection according to IEC 529) the possibility of replacing the power semiconductor (IEC ) accessibility for maintenance and adjustment work precautions against the interchange of plug-in assemblies and plug connectors compliance with the clearance and creepage distances for which allowance is to be made according to the fouling grade and the overvoltage category on which it is based An evaluation of the used material (flame-retardant, halogen-free), the cooling system, the cable connection spaces etc. shall also be made (IEC ). The tests shall be evaluated as having been passed if the specimen meets the requirements of the Rules for Classification and Construction, the Regulations, the IEC publications as well as the stipulations of the specification and in the documentation, and if there are no visible defects. 2. Performance Test Method In its scope the performance test corresponds to a normal workshop test where operational functions, control and monitoring are checked. Malfunctions such as the failure of forced ventilation shall be simulated. In UPS systems one of the tests conducted covers the operation of the system in case of an earth fault in the load circuit or in case of unbalanced load. For information on the test conditions see: Regulations for the performance of type tests, Part 1, Test requirements for electrical/electronic equipment, computers and peripherals, Section 3, B.2.2 s

10 Chapter 7 Page 3 2 Section 3 B Test Requirements VI - Part 7 The test is evaluated as having been passed when the specified functions have been demonstrated, the results are within the prescribed tolerances, the results of simulated faults conform to specification and the Construction Rules and if the test piece shows no sign of damage. Note: Filter currents which are discharged in the IT network against the ship s hull must meet the provisions of IEC Power Supply Failure The supply voltage shall be interrupted three times for about 30 seconds within 5 minutes. The test shall be performed with the rated operational voltage Ue. The test shall be repeated several times as appropriate, in various states of operation. power failures forced do not cause any damage to or malfunctioning of the test piece. 4. Power Supply Variations The test piece is connected to a voltage source with variable frequency and voltage. Several tests shall be conducted with frequency and voltage deviations: Table 3.1 Test Voltage deviation Frequency deviation Admissible period % + 5 % continual % 5 % continual 3 10 % 5 % continual 4 10 % + 5 % continual % 1,5 s 6 20 % 1,5 s % 5 s 8 10 % 5 s In the case of the frequency and voltage deviations which are within the continual category testing must continue until the test piece attains a steady state. For battery power supplies voltage deviations of + 30 % and 25 % must be considered. For semiconductor static converters the fact must be considered that the power components are also connected to the ship s fluctuating supply voltage. Clarification must be given on a case by case basis whether tests 5 to 8 also need to be conducted with the power component in different operating states (idling, operating, braking). The test is evaluated as having been passed when the variations in the power supply do not lead to a malfunction or cause damage to the test piece. At larger deviations the test piece must operate in a safe operating state. 5. Input and Output Current and Voltage Diagrams The test piece shall be operated as specified at full load, half load and no load. The input and output current and voltage diagrams are to be plotted accordingly. If the test piece is functioning properly the current and potential curves must be symmetrical. An evaluation shall be carried out of the voltage peaks (needles) and commutation breaks. The harmonic content of the voltage is not permitted to exceed 5 % ( Construction Rules, Chapter 3, Electrical Installations, Section 1, F.). Note: Due to the fact that the mains reactance affects the current and potential curves, additional measures may have to be implemented on board. 6. Overload Test Load which exceeds the permitted load shall be applied to the output of the test piece. Where the manufacturer has specified load limits within a time limit these loads shall be checked together with monitoring of the temperatures of endangered parts. Overload of the test piece shall be prevented by effectively limitation of the current ( Construction Rules, Chapter 3, Electrical Installations, Section 4, F.). No component shall suffer damage due to excessive temperatures. 7. Short Circuit Test The test piece output has to be short-circuited.

11 VI - Part 7 Section 3 B Test Requirements Chapter 7 Page 3 3 The short circuit on the load side shall not cause destruction of any components except those of fuses ( Construction Rules, Chapter 3, Electrical Installations, Section 4, F.). 8. Short Circuit Fuse Test If the test sample is an item such as a power supply unit, an UPS or a comparable item of equipment this test shall be conducted. A short circuit has to be initiated behind the largest fuse permitted to be installed in the network according to manufacturers manual. If a short circuit current capability is specified the current values shall be recorded. The test shall be performed under normal conditions with appropriate load. The test shall be performed twice. (cf. IEC 146-4). continuance of the output voltage is not affected, the fuses have been broken in due time and the recorded current values are within the prescribed limits. 9. Temperature-rise Test a) The test piece, fitted in an enclosure according the specified degree of protection, shall be operated at rated load until the steady state temperature is reached. The temperature inside the housing, the temperature of endangered components and the ambient temperature shall be recorded at agreed intervals. b) Alternatively, a thermal balance (loss calculation) may be accepted. a) A temperature-time diagram shows that the maximum permissible temperature in the housing was not exceeded ( Construction Rules, Chapter 3, Electrical Installations, Section 5, B). b) The thermal balance (loss calculation) indicates that no unacceptable increase in temperature is anticipated. 10. Cold The performance of the test shall be according to the Regulations for the Performance of Type Tests Part 1, Section 3, B.5 Table 3.2 Conditions inside the test chamber for environmental categories A and C Temperature 0 C ± 3 C Test duration 2 h specified functions have been demonstrated, if the results are within the prescribed tolerances, the values of the insulation resistance measurement are within the prescribed limits and if the test piece shows no sign of damage. 11. Dry Heat Performance of the test shall be according to the Part 1, Section 3, B.6. Table 3.3 Conditions inside the test chamber for environmental categories Temperature 55 C ± 2 C 70 C ± 2 C Relative humidity at test temperature A C 20 % 20 % Test duration 16 h 2 h specified functions have been demonstrated, if the results are within the prescribed tolerances and if the test piece shows no sign of damage. 12. Damp Heat Performance of the test shall be according to the Part 1, Section 3, B.7. Table 3.4 Conditions inside the test chamber for environmental categories A and C Temperature 55 C ± 2 C Relative humidity 95 % Test duration 2 cycles of tests, 12 h each

12 Chapter 7 Page 3 4 Section 3 B Test Requirements VI - Part 7 specified functions have been demonstrated, if the results are within the prescribed tolerances, the values of the insulation resistance measurement are within the prescribed limits and if the test piece shows no sign of damage. 13. Vibration Performance of the shall be according to the Part 1, Section 3, B.9. The test may also be performed in several steps on individual system components. Table 3.5 General vibration loads conforming to characteristic 1 for the ambient conditions A and C Amplitude 2 (+ 3/ 0) Hz ± 1,0 mm Acceleration 13,2 Hz to 100 Hz 0,7 g Frequency change max. 1 octave/ minute specified functions have been demonstrated, if the results are within the prescribed tolerances and if the test piece shows no sign of damage. 14. Inclinations Performance of the test shall be according to the Regulations for the Performance of Type Tests, Part 1, Section 3, B.10. This test is necessary only if it is expected that due to the mechanical design of the test piece its function could be affected by the inclination. specified functions have been demonstrated, if the results are within the prescribed tolerances and if the test piece shows no sign of damage. 15. Insulation Resistance This test shall be made before and after the high voltage test (-16-), the cold test (-10-) and the damp heat test (-12-). The same terminals shall be used for the measurement as are used for the high voltage test values are not lower than those given in the table below: Table 3.6 Rated operational voltage U e Test voltage Minimum insulation resistance AC/DC DC R iso before R iso after 65 V 2 U e ; min 24 V 10 MΩ 1 MΩ > 65 V 500 V 100 MΩ 10 MΩ 16. High Voltage The test shall be made with alternating voltage at the rated operational frequency. Table 3.7 Rated operational voltage [V] Test voltage [V] U e 65 2 U e to to to Test voltage shall be applied for one minute. Tests are carried out on electric circuits with different rated operational voltages or electrically isolated electric circuits relative to each other and relative to the housing. The semiconductors may be bridged for this test. Control fuses and printed circuits with electronic components may be removed. Overvoltage protection devices may be bridged, isolated on one side or removed, after having passed a function check. The test is evaluated as having been passed if no voltage spark-over occurs, the overvoltage protection devices installed are operative as specified and the values of the insulation resistance measurement are within the prescribed limits.

13 VI - Part 7 Section 3 B Test Requirements Chapter 7 Page Electrostatic Discharges Performance of the test shall be according to the Part 1, Section 3, B.15. This must correspond to the Regulations for the Performance of Type Tests, Part 1, Section 3, B.15 (Performance criterion B, see the Regulations for the Performance of Type Tests, Part 1, Section 3, A.3). 18. Electromagnetic Fields Performance of the test shall be according to the Part 1, Section 3, B.16. This must correspond to the Regulations for the Performance of Type Tests, Part 1, Section 3, B.16 (Performance criterion A, see the Regulations for the Performance of Type Tests, Part 1, Section 3, A.3). 19. Conducted fast Transients ( Burst) Performance of the test shall be according to the Part 1, Section 3, B.17. This must correspond to the Regulations for the Performance of Type Tests, Part 1, Section 3, B.17 (Performance criterion A, see the Regulations for the Performance of Type Tests, Part 1, Section 3, A.3). 20. Conducted high Frequency Interference Performance of the test shall be according to the Part 1, Section 3, B.18. This must correspond to the Regulations for the Performance of Type Tests, Part 1, Section 3, B.18 (Performance criterion A, see the Regulations for the Performance of Type Tests, Part 1, Section 3, A.3). 21. Conducted slow Transients (Surge) Performance of the test shall be according to the Part 1, Section 3, B.19. This must correspond to the Regulations for the Performance of Type Tests, Part 1, Section 3, B.19 (Performance criterion A, see the Regulations for the Performance of Type Tests, Part 1, Section 3, A.3). 22. Conducted low Frequency Interference (Harmonics) Performance of the test shall be according to the Part 1, Section 3, B.20. This must correspond to our Regulations for the Performance of Type Tests, Part 1, Section 3, B.20 (Performance criterion A, see the Regulations for the Performance of Type Tests, Part 1, Section 3, A.3). 23. Conducted Emission The EMC property of the test piece as a source of interference shall be evaluated. The circuit related interference shall be established in a series of measurements according to Regulations for the Performance of Type Tests, Part 1, Section 3, B.21. test piece does not exceed the values specified in the Part 1, Section 3, B.21. Note: The measurement may be performed using a probe if a coupling network cannot be used due to high connection power (IEC 61800). 24. Radiated Emissions from Enclosure Ports The EMC property of the test piece as a source of interference shall be evaluated. The radiated magnetic H and electric E fields shall be established in a series of measurements according to Regulations for the Performance of Type Tests, Part 1, Section 3, B22.

14 Chapter 7 Page 3 6 Section 3 B Test Requirements VI - Part 7 Note: measured levels do not exceed the values specified in the Regulations for the Performance of Type Tests, Part 1, Section 3, B.22. The voltage rate of rise occurring in the test piece is severely affected by the grid reactance. When conducting tests 17 to 24, the test piece should be supplied by an IT network.

15 VI - Part 7 Annex A Required Tests (Summary) Chapter 7 Page A 1 Annex A Required Tests (Summary) Table A.1 No. Test Page Required 1 Visual inspection Performance test Power supply failure Power supply variations Current and voltage diagrams Overload test Short-circuit test Short-circuit fuse test Temperature-rise test Cold Dry heat Damp heat Vibration Inclinations Insulation resistance High voltage Electrostatic discharge Electromagnetic fields Conducted fast transients (Burst) Conducted high frequency interference Conducted slow transients (Surge) Conducted low frequency interference (Harmonics) Conducted emission Radiated emissions from enclosure ports 3 6 Already performed Test accepted

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