1 VDE-QT-PV001:2012/01 VDE-QT-PV001:2012/01 Combined IEC 61215 ed.2, IEC 61730-1 ed. 1, IEC 61730-2 ed.2 plus VDE addendums
2 VDE-QT-PV001:2012/01 CONTENTS 1 Scope and object 5 2 Normative references 5 3 Sampling 7 4 Marking 7 5 Testing 7 6 Pass criteria 7 7 Major Visual defects 7 8 Report 7 9 Modifications 8 10 Test procedure 9 10.1 Visual Inspection 10 10.2 Maximum power determination 10 10.3 Insulation test 10 10.4 Measurement of temperature coefficients 10 10.5 Measurement of nominal operating cell temperature (NOCT) 10 10.6 Performance at STC and NOCT 10 10.7 Performance at low irradiance 10 10.8 Outdoor exposure test 10 10.9 Hot-spot endurance test 10 10.10 UV preconditioning test 10 10.11 Thermal cycling test 10 10.12 Humidity-freeze test 10 10.13 Damp-heat test 11 10.14 Robustness of terminations test 11 10.15 Wet leakage current test 11 10.16 Mechanical load test 11 10.17 Hail Test 11 10.18 Bypass diode thermal test 11 10.19 EL-measurement 11 10.20 Dynamic mechanical load test 17 11 Requirements for construction 17 12 Requirements for safety testing 18 12.1 Application classes 18 12.2 Test categories 18 12.3 Application classes and their necessary test procedures 18 12.4 Sampling 18 12.5 Test Report 18
3 VDE-QT-PV001:2012/01 12.6 Testing 18 12.7 Pass criteria 18 12.8 Test procedures 18 12.8.1 Visual Inspection MST 01 18 12.8.2 Accessibility test MST 11 18 12.8.3 Cut susceptibility test MST 12 18 12.8.4 Ground continuity test MST 13 18 12.8.5 Impulse voltage test MST 14 19 12.8.6 Partial discharge test MST 15 19 12.8.7 Dielectric withstand test MST 16 19 12.8.8 Wet leakage current test MST 17 19 12.8.9 Temperature test MST 21 19 12.8.10 Hot-spot test MST 22 19 12.8.11 Fire test MST 23 19 12.8.12 Bypass diode thermal test MST 25 19 12.8.13 Reverse current overload test MST 26 19 12.8.14 Module breakage test MST 32 19 12.8.15 Conduit bending test MST 33 19 12.8.16 Mechanical load test MST 34 19 12.8.17 Robustness of terminations MST 42 19 12.8.18 Terminal box knock out test 20 12.8.19 Thermal cycling test 200 cycles MST 51a 20 12.8.20 Thermal cycling test 50 cycles MST 51b 20 12.8.21 Humidity freeze test MST 52 20 12.8.22 Damp heat test MST 53 20 12.8.23 UV-resistance test MST 54 20 13 In line testing 20 13.1 Tests 20 13.2 Documentation 21 14 Off Line Testing (Quarterly testing) 21 14.1 Sampling 21 14.2 Tests for all modules 21 14.2.1 Visual Inspection 21 14.2.2 Maximum power determination 21 14.2.3 EL-check 21 14.3 Tests for 4 Modules 21 14.3.1 Preconditioning 21 14.3.2 Insulation test 21 14.3.3 Wet leakage test 21
4 VDE-QT-PV001:2012/01 14.3.4 Dynamic load test 21 14.3.5 Thermal cycling test 22 14.3.6 Hot-spot test 22 14.3.7 Damp heat test 22 14.3.8 Wiring compartment test 22 14.3.9 Reverse current overload test 22 14.3.10 Ground continuity test 22 14.4 Test sequence 23 15 Corrective actions 24 15.1 Routine testing 100% 24 15.2 Routine testing 1% / daily tests 24 15.3 Quarterly testing 24
5 VDE-QT-PV001:2012/01 VDE-QT-PV-001 (Combined IEC 61215 ed.2, IEC 61730-1 ed. 1, IEC 61730-2 ed.2 plus VDE addendums) Crystalline silicon terrestrial Photovoltaic (PV) Modules DESIGN QUALIFICATION, TYPE APPROVAL AND PHOTOVOLTAIC (PV) MODULE SAFETY QUALIFICATION 1 Scope and object This test base lays down requirements for the design qualification and type approval of crystalline silicon terrestrial photovoltaic modules. It is based on IEC 61215, IEC 61730-1, IEC 61730-2 and UL 1703. It is written because initial module design certification and snapshot-wise control of manufacturing processes are both critical in ensuring high quality and reliable products in mass production. The 3 core issues are: 1. Stricter module design and safety qualification requirements 2. Continuous inline quality monitoring during mass production 3. Continuous offline process and quality monitoring of production sites The core issues lead to: Higher confidence in product quality due to continuous product monitoring on a stable statistical data base (larger sample size, higher sample frequency, combination of inline and offline tests) Proven long-term reliability due to continuous product and production site monitoring Better return on investment due to proven high reliability and low power degradation, i.e. minimized investment risk Increased bankability 2 Normative references The following referenced documents are indispensable for the application of this document. For dated references, only the edition cited applies. For undated references, the latest edition of the referenced document (including any amendments) applies. IEC 61215: Crystalline silicon terrestrial photovoltaic (PV) modules Design qualification and type approval. IEC 61730-1: Photovoltaic (PV) module safety qualification Part 1: Requirements for
6 VDE-QT-PV001:2012/01 construction IEC 61730-2: Photovoltaic (PV) module safety qualification Part 2: Requirements for testing UL 1703 Flat-Plate Photovoltaic Modules and Panels VDE PM 434: Test instruction for Factory Surveillance of terrestrial photovoltaic (PV) modules in accordance with VDE 0126-30-1, -30-2, -31, -32.
7 VDE-QT-PV001:2012/01 3 Sampling This clause of IEC 61215 is applicable except the following modification: Number of samples: 14 modules. 4 Marking 5 Testing 6 Pass criteria This clause of IEC 61215 is applicable except the following modification: Pass / fail criteria is 5% max degradation between the single sequences and overall. 7 Major visual defects 8 Report
8 VDE-QT-PV001:2012/01 Table 1 Summary of test levels Test Title Test conditions 10.1 Visual inspection See IEC 61215 10.2 Maximum power determination See IEC 60904-1 10.3 Insulation test See IEC 61215 10.4 Measurement of temperature coefficients See IEC 61215 10.5 Measurement of NOCT See IEC 61215 10.6 Performance at STC and NOCT See IEC 61215 10.7 Performance at low irradiance (see note 1) See IEC 61215 10.8 Outdoor exposure test See IEC 61215 10.9 Hot-spot endurance test See IEC 61215 10.10 UV Preconditioning See IEC 61215 10.11 Thermal cycling test 50 and 2 times 200 cycles from 40 C to + 85 C with STC peak power current during 2 times 200 cycles 10.12 Humidity-freeze test 10 cycles from +85 C, 85 % RH to 40 C 10.13 Damp-heat test 1000 h and 500 h at +85 C, 85 % RH 10.14 Robustness of termination test See IEC 61215 and UL 1703 Clause 42 Wiring compartment Securement test 10.15 Wet leakage current test See IEC 61215 10.16 Mechanical load test See IEC 61215 10.17 Hail test See IEC 61215 10.18 Bypass diode thermal test See IEC 61215 10.19 EL-measurement See 10.19 10.20 Mechanical cycling test 1000 cycles with 1000 Pa for front and rear side 9 Modifications The IEC 61215 and IEC 61730-2 retesting guideline is applicable except the following modification: The relevant test sequences of VDE-PV-QT-001 apply.
9 VDE-QT-PV001:2012/01 10 Test procedure
10 VDE-QT-PV001:2012/01 10.1 Visual inspection 10.2 Maximum power determination 10.3 Insulation test 10.4 Measurement of temperature coefficients 10.5 Measurement of nominal operating cell temperature (NOCT) 10.6 Performance at STC and NOCT 10.7 Performance at low irradiance 10.8 Outdoor exposure test 10.9 Hot-spot endurance test 10.10 UV preconditioning test 10.11 Thermal cycling test This clause of IEC 61215 is applicable except the following addition: 10.11.4 Final measurements After a minimum recovery time of 1 h, repeat the tests of 10.1, 10.2 and 10.3. For TC 200, repeat the whole sequence. 10.12 Humidity-freeze test
11 VDE-QT-PV001:2012/01 10.13 Damp-heat test This clause of IEC 61215 is applicable except the following modification: 10.13.3 Final measurements After a recovery time of between 2 h and 4 h, repeat the tests of 10.3 and 10.15. Repeat the tests of 10.1 and 10.2. Repeat the whole sequence for additional 500 h. 10.14 Robustness of terminations test This clause of IEC 61215 is applicable with the following addition: 10.14.3.4 Wiring compartment Securement test 10.14.3.5 The tensile force required to separate a wiring compartment or box from a module shall not be less than 156 N ± 1 N (16kg) or 4 times the weight of the wiring compartment or the box, whichever is greater. For a test in which the superstrate or substrate fails prior to the adhesive, the force required to cause the superstrate or substrate to fail shall be used to determine compliance, and shall not be less than the specified minimum separation force. 10.14.3.6 The force is to be applied so as to separate the wiring compartment or box from the module. The force is to be applied for 2 minutes. 10.14.3.7 Final measurements Repeat the tests of 10.1, 10.2, 10.3 and 10.15 10.15 Wet leakage current test 10.16 Mechanical load test 10.17 Hail test 10.18 Bypass diode thermal test 10.19 EL measurement 10.19.1 Purpose Purpose of this test is to identify cracks in cells which are caused in the module manufacturing process that might influence the long term reliability of the module.
12 VDE-QT-PV001:2012/01 10.19.2 EL-Setup CCD-camera or even better an IR-camera that is sensitive in the range of 1200 to 1000nm (c- Si). Resolution: 1 pixel in the image should represent not more then 1 mm² on the PV module (e.g. 1.6Mpix for a 1.6m² module): Wafer brick patterns, grain boundaries, grid-fingers, finger interruptions, contact pads from backside/front side, cracks etc. must be clearly visible. Image processing (stitching, cropping, contrast) can be done, but effects like antialiasing should be avoided UV-VIS filters to block unwanted light coming from the surrounding walls can be used A DC power supply shall be connected to the module with positive output connected to the positive terminal of the module. A current of I sc +/-10% must be driven through the module Integration time must be adjusted to reach best possible signal-to-noise ratio (typically between 5 and 100secs) 10.19.3 EL failure catalogue 10.19.3.1 Cell cracks a): Cracks w/o dark areas and possible finger interrupts. Not allowed: greater than 2 cracks in any one cell greater than 3 cracked cells within a 60 cell module dark lines/curves over one or several cells with "tree-pattern like cracks
13 VDE-QT-PV001:2012/01 Accept if Examples Cell type Mono c-si Cells Pass Fail Cell type Multi c-si Cells Pass Fail
14 VDE-QT-PV001:2012/01 b) Isolated cell area A part of the cell is isolated from the active area due to cracking. An isolated area is defined as one in which there is no redundant current path connecting it to the active area of the cell. Not allowed: Examples greater than 10% area isolated within any one cell greater than 3 cells with less than 10% area isolated within a 60 cell module Cell type Mono c-si Cells Pass Fail Cell type Multi c-si Cells Pass Fail
15 VDE-QT-PV001:2012/01 10.19.3.2 Dark cells Cells uniformly dark due to a short through cell, damaged diode, or mismatched cell bins. Not allowed: Any cell that is completely dark (with or without halo) Any group/string of cells that is completely dark Generally not allowed, because of Hot-Spot risk Examples Cell type Mono c-si Cells Fail Cell type Multi c-si Cells Fail
16 VDE-QT-PV001:2012/01 10.19.3.3 Native cell issues Native cell issues include: wafer repetitive patterns, ingot edge marks, scratches or other artificial structures. Modules are not rejected for any of these defects because they have no long term impact on module reliability or performance. Allowed: Scratches or artificial structures Finger interrupts caused by screen-printing issues (mostly repeatedly visible in one module) Examples Cell type Mono c-si Cells Pass Cell type Multi c-si Cells Pass
17 VDE-QT-PV001:2012/01 10.20 Dynamic mechanical load test 10.20.1 Purpose The purpose of this test is to ensure that the test module can withstand wind gust loading. It also enables the evaluation of power loss associated with broken cells. 10.20.2 Apparatus A rigid test base which enables the modules to be mounted according to the manufacturers specifications. The test base shall enable the module to deflect freely during the load application. Suitable equipment or pressure means that enable the load to be applied in a gradual, uniform manner 10.20.3 Procedure Mount the module on the test base using the method prescribed by the manufacturer. If there are different possibilities, use the worst case, where the distance between the fixing points is at maximum. Across the surface of the module, uniformly cycle a load of at minimum ±1000 Pa, for 1000 times (1 cycle consists of a positive load of 1000 Pa and a negative load of 1000 Pa.) The rate of cycling shall be no less than 0.1 Hz and no more 1Hz. 10.20.4 Final measurements Repeat the tests of 10.1, 10.2, 10.3 and 10.15 10.20.5 Requirements The requirements are as follows: No evidence of major visual defects, as defined in Clause 7; The degradation of maximum output power shall not exceed 5% of the value measured before the test; Insulation resistance meets the same requirements as for the initial measurement 11 Requirements for construction IEC 61730-1 applies without modification.
18 VDE-QT-PV001:2012/01 12 Requirements for safety testing 12.1 Application classes Clause 3 of IEC 61730-2 is applicable. 12.2 Test categories Clause 4 of IEC 61730-2 is applicable. 12.3 Application classes and their necessary test procedures Clause 5 of IEC 61730-2 is applicable. 12.4 Sampling Clause 6 of IEC 61730-2 is applicable. 12.5 Test Report Clause 7 of IEC 61730-2 is applicable. 12.6 Testing Clause 8 of IEC 61730-2 is applicable. 12.7 Pass criteria Clause 9 of IEC 61730-2 is applicable. 12.8 Test procedures Clause 10 of IEC 61730-2 is applicable. 12.8.1 Visual Inspection MST 01 Clause 10.1 of IEC 61730-2 is applicable. 12.8.2 Accessibility test MST 11 Clause 10.2 of IEC 61730-2 is applicable. 12.8.3 Cut susceptibility test MST 12 Clause 10.3 of IEC 61730-2 is applicable. 12.8.4 Ground continuity test MST 13 Clause 10.4 of IEC 61730-2 is applicable.
19 VDE-QT-PV001:2012/01 12.8.5 Impulse voltage test MST 14 Clause 10.5 of IEC 61730-2 is applicable. 12.8.6 Partial discharge test MST 15 Clause 11.1 of IEC 61730-2 is applicable. 12.8.7 Dielectric withstand test MST 16 Clause 10.6 of IEC 61730-2 is applicable. 12.8.8 Wet leakage current test MST 17 Clause 10.15 of IEC 61215 is applicable. 12.8.9 Temperature test MST 21 Clause 10.7 of IEC 61730-2 is applicable. 12.8.10 Hot-spot test MST 22 Clause 9 of IEC 61215 is applicable. 12.8.11 Fire test MST 23 Clause 10.8 of IEC 61730-2 is applicable. 12.8.12 Bypass diode thermal test MST 25 Clause 10.18 of IEC 61215 is applicable 12.8.13 Reverse current overload test MST 26 Clause 10.9 of IEC 61730-2 is applicable. 12.8.14 Module breakage test MST 32 Clause 10.10 of IEC 61730-2 is applicable. 12.8.15 Conduit bending test MST 33 Clause 11.2 of IEC 61730-2 is applicable. 12.8.16 Mechanical load test MST 34 Clause 10.16 of IEC 61215 is applicable. 12.8.17 Robustness of terminations MST 42
20 VDE-QT-PV001:2012/01 MST 42: 10.14.3.4 must be performed in addition. 12.8.18 Terminal box knock out test Clause 11.3 of IEC 61730-2 is applicable. 12.8.19 Thermal cycling test 200 cycles MST 51a Clause 10.11 of IEC 61215 is applicable together with the additions of clause 10.11.4 of VDE- QT-PV001. 12.8.20 Thermal cycling test 50 cycles MST 51b Clause 10.11 of IEC 61215 is applicable. 12.8.21 Humidity freeze test MST 52 Clause 10.12 of IEC 61215 is applicable. 12.8.22 Damp heat test MST 53 Clause 10.13 of IEC 61215 is applicable together with the additions of clause 10.13.3 of VDE QT-PV001. 12.8.23 UV-resistance test MST 54 Clause 10.10 of IEC 61215 is applicable. 13 In line testing 13.1 Tests The tests listed in PM 434 are applicable with the following additional tests: Additional Tests: Routine test 100%: EL testing in accordance with 10.19. Routine test 1% of the modules produced per day: Wet-Leakage test in accordance with 10.15. Routine test 1 sample per site per day: Grounding test in accordance with IEC 61730-2, MST 13 except that I test >= Ir Reverse current overload test in accordance with IEC 61730-2, MST 26 except that I test >= Ir
21 VDE-QT-PV001:2012/01 13.2 Documentation The test results must be documented in MS-Excel and must be forwarded for inspection to VDE together with the samples for Quarterly Tested (clause 14). 14 Off Line Testing (Quarterly testing) 14.1 Sampling: Randomly sampled modules to get each laminator/stringer checked within a year (dependent on lines/sub lines). Min. 20 Modules or one standard shipping box/palette per quarter including the complete documentation about the Routine Testing (clause 13) in MS-Excel for the modules produced in the last quarter. 14.2 Tests for all modules: 14.2.1 Visual inspection In accordance with clause 10.1 including check of the electrical sorting criteria (ESCs). 14.2.2 Maximum power determination In accordance with 10.2. Additionally compare the power measured at the initial power measurement with the power given on the label. The results must be within the tolerance specified by the manufacturer. Compare with original factory measurement and compare with label. (Should be shipped) 14.2.3 EL-check In accordance with clause 10.19. EL inspection for transportation failures and EL-sorting verification. 14.3 Tests for 4 Modules (plus control sample) 14.3.1 Preconditioning Modules shall be exposed to sunlight (real or simulated) of an irradiation level of 5 kwh/m² to 5,5 kwh/m² 14.3.2 Insulation test In accordance with clause 10.3 14.3.3 Wet leakage test In accordance with clause 10.15 14.3.4 Dynamic load test In accordance with clause 10.20
22 VDE-QT-PV001:2012/01 14.3.5 Thermal cycling test In accordance with clause 10.11 with the following modification: Number of Cycles 100. 14.3.6 Hot-spot test In accordance with clause 10.9 14.3.7 Damp heat test In accordance with clause 10.13 except the following modification: Testing time is 250 h. 14.3.8 Wiring compartment Securement test In accordance with clause 10.14.3.4. 14.3.9 Reverse current overload test In accordance with MST 26 of IEC 61730-2. 14.3.10 Ground continuity test In accordance with IEC 61730-2, MST 13
23 VDE-QT-PV001:2012/01 14.4 Test Sequence
24 VDE-QT-PV001:2012/01 15 Corrective actions In this clause the corrective actions are described which must be taken in case of failures within the 100% routine testing, the routine testing 1% or the daily tests. Every failure must be reported to VDE immediately. 15.1 Routine testing 100% If only one module fail test check for the reason (e.g. defective j-box cable) and assume single event keep production running, check e.g. incoming goods inspection create report. If more modules are failing the tests assume process related or material related issue. Stop production and figure out / solve the problem. Create report. 15.2 Routine testing 1% / daily tests Check one module produced before and after failed module. If one of the 2 modules failed assume process related issue stop production and investigate the problem. Create report. If both modules pass, assume failure was a single event keep production running and create report for VDE. 15.3 Quarterly testing If one module fails, investigate the issue and create report. If only one module is tested in the sequence, test a second one. If the second one passes the relevant tests, take it as a single event. If more than one module fails the quarterly testing, a systematic problem must be assumed. The Quality-Tested mark is not valid anymore. Remove the label from last quarter s production and check if modules still fulfill IEC criteria, if not, recall modules.