R&D Fast and lightweight EIC integrated tracking system Barrel MicroMegas & Forward Triple-GEM

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1 R&D Fast and lightweight EIC integrated tracking system Barrel MicroMegas & Forward Triple-GEM Franck Sabatie (PI) Matt Posik, Maxence Vandenbroucke, Bernd Surrow (PI)

Outline 2 Overview of R&D program Motivation Simulations Forward GEM tracking Barrel MicroMegas tracking Front-End Readout System Summary

Overview of EIC R&D program 3 Introduction R&D effort focuses on intermediate tracking system: Barrel tracking system based on MicroMegas detectors manufactured as cylindrical shell elements and Rear / Forward Forward tracking system based on triple-gem detectors manufactured as planar segments. R&D effort - Main strategy: Design and assembly of large cylindrical MicroMegas detector elements and planar triple-gem detectors Test and characterization of MicroMegas and triple-gem prototype detectors Design and test of new chip readout system employing CLAS12 DREAM chip development, ideally suited for micro-pattern detectors Utilization of light-weight materials Development and commercial fabrication of various critical detector elements European/US collaborative effort on EIC detector development (CEA Saclay, and Temple University)

Motivation 4 Considerations on Tracking System Tracking over wide acceptance range: Forward with ~1 and Rear with ~179, excluding very forward/rear detector regions Contribute to reconstruction of event kinematics besides calorimetry in particular at very small energies forward barrel rear High-rate environment (~10MHz ep collisions) Fast time response Precision hit resolution, e.g. low Q 2 region Minimal dead material (~1% X 0 ) Cost effective solution for large tracking detector areas Profit from world-wide micro-pattern detector development (RD51 Collaboration) E e /E p =0.1

Simulations 5 EICROOT simulation framework! GEANT Implementation of barrel MicroMegas and rear/ forward triple-gem system Resolution studies / Kinematics Dead material studies DVCS physics simulations (a) (b) 0.064X0 0.064X0 A. Kiselev (BNL) (a) (b)

Forward GEM Tracking 6 Introduction Weekly coordination meetings between Tech-Etch, CERN, FIT, Yale and Temple University: GEM foils and 2D (a) (b) readout foils (a) (b) (c) No spacers (e.g. Kapton ring) Gas piping in frame HV routing embedded in frames (a) (d) (e) FEE in larger radial region / DREAM chip (b) (c) (d)

Forward GEM Tracking 7 Laboratory facilities at Temple University (Current Department of Physics) Setup of three labs concerning CCD scans, assembly and testing Characterization of GEM foils in terms of leakage current and optical uniformity routinely performed Assembly of triple-gem test detectors (c) Setup of cosmic-ray test and 55Fe (a) source scanner DAQ and HV system (d) Mechanical design studies on large triple-gem detector segment Commercialization of large GEM foil production using single-mask manufacturing techniques (b) (e)

Forward GEM Tracking 8 New Laboratory facilities at Temple University (New Department of Physics) (a) (d) Science Education and Research Center 5th floor Class 1,000 Clean Room GEM Assembly Lab 4th floor Basement (b) GEM testing lab (c) Basement - Machine Shop

Forward GEM Tracking 9 Highlight: Commercial fabrication of single-mask produced GEM foils Successful fabrication of single-mask produced GEM foils in collaboration with FIT, Temple University and Yale University Processing steps: Copper&5&μm Chrome&10&nm Polyimide&50&μm Single-Mask GEM foil (40cm X 40cm) Single-Mask GEM foil (10cm X 10cm) Copper&5&μm Photoresist (a) Coating of photoresist and laser direct imaging Photoresist Unexposed&Resist (b) Removal of unexposed photoresist and etching of copper and removal of Chrome adhesive layer (a) (b) (c) 1st polyimide etching in EDA chemistry (d) Electrolyte etching and removal of ~&50&μm ~&50&μm backside copper (c) ~&25&μm ~&25&μm (d) ~&25&μm ~&25&μm (e) (e) 2nd polyimide etching in EDA chemistry

Forward GEM Tracking 10 GEM Foil Electrical tests at Temple University / Leakage current (1) Setup of leakage current measurement at Temple University Setup including nitrogen box with HV connections ISEG power supply and na current measurement

Forward GEM Tracking 11 GEM Foil Electrical tests at Temple University / Leakage current (2) Results for large GEM foil Settled Current (na) 0.4 0.3 0.2 0.1 0 700 600 500 400 300 200 100 Voltage (V) Very small currents < 1nA repeatedly measured on 1 2 3 4 5 6 7 8 9 10 FGT Sector several small samples up to 600V Above example is for a large GEM foil

Forward GEM Tracking 12 GEM Foil CCD scans setup 2D scanning table with CCD camera fully automated Scan GEM foils to measure hole diameter (inner and outer) and pitch (a) (c) (b)

Forward GEM Tracking 13 GEM Foil CCD scan results: Small samples (1)

Forward GEM Tracking 14 GEM Foil CCD scan results: Small samples (2) 80 Inner Hole Diameter Comparison (Lot# 626524) Diameter Mean (µm) 70 60 50 40 80 44 46 48 50 52 54 56 Foil Number Outer Hole Diameter Comparison (Lot# 626524) Diameter Mean (µm) 70 60 50 Temple Tech-Etch 40 44 46 48 50 52 54 56 Foil Number

Forward GEM Tracking 15 GEM Foil CCD scan results: Large samples

Barrel MicroMegas tracking 16 Introduction Curved Micromegas for barrel based on carbon structure glued on thin PCB Idea validated for CLAS12 tracker Need to increase size, but studies and simulation are needed : PCB size, mesh tension, capacitance and gain homogeneity More R&D needed!

Barrel MicroMegas tracking 17 Laboratory facilities at Saclay Recent 12-detector test at CERN Development Saclay Micromegas workshop Micromegas detectors build either at outside company (CERN/CIREA) or at Saclay workshop Tests done in CLAS12 lab with fully-equipped cosmictest stand incl. reference detector Mesh stretcher Cleaning Insulator Laminator

Barrel MicroMegas tracking 18 Highlight: Assembly and test of curved MicroMegas cylindrical segments (1) Successful assembly of small radius prototype Challenge: Mechanical stress due to large bending C/Z readout structure Readout through DREAM chip system (a) (c) (b) (d)

Barrel MicroMegas tracking 19 Highlight: Assembly and test of curved MicroMegas cylindrical segments (2) First efficiency results are reasonable / Further optimization with operating HV and gap Further R&D on mechanical deformation Z [mm] 710 700 690 680 670 660 650 (a) 140 160 180 200 220 240 260 280 300 320 340 X [mm] (b)

Barrel MicroMegas tracking 20 Front-End Electronics development Front-End crate Gigabit Ethernet Switch DAQ PC 3 FEU s 1 TCM Data and Slow control Data Micro-coaxial cables 2 Passive readout cards Triple-GEM detector Successful setup of complete new chip readout system ideally suited for Micropattern detectors Successful test with MicroMegas detector Design of triple-gem readout system using DREAM chip Dream Chip APV25-S1 Chip Number of channels 64 128 Memory size 512 160 Latency 16µs 8µs Noise (e-rms) 2100 (On 180pF) 1200 (On 20pF) Sampling frequency 1-40MHz 10-50MHz Dynamic range 50-600fC 150fC Input capacitance 150pF 18pF Shaping time 70ns 50ns

Summary 21 Summary Forward GEM tracking Characterization of GEM foils in terms of leakage current and optical uniformity Assembly of small (10 X 10 cm2) triple-gem test detectors Setup of cosmic-ray test and 55Fe source scanner / DAQ and HV system Mechanical design studies on large triple-gem detector segment and support structure Commercialization of large GEM foil production using single-mask manufacturing techniques Spacer grid studies: Grid and Kapton rings Barrel MicroMegas tracking Successful assembly of two flat CLAS12 MicroMegas detectors Successful test of light-weight, low capacitance flex cables Test of first DREAM chip production version Test of a small radius chamber Outlook Design, assembly and test of larger segments Goal: Establish US/EU Ph.D. program between Temple University and Paris 6 / Orsay