Hitachi Tabletop Microscope TM4000 / TM4000 Plus TM4000 Series Notice: For correct operation, follow the instruction manual when using the instrument. Specifications in this catalog are subject to change with or without notice, as Hitachi High-Technologies Corporation continues to develop the latest technologies and products for our customers. Copyright (C) Hitachi High-Technologies Corporation 2017 All rights reserved. /global/em/ For technical consultation before purchase, please contact:contact@nst.hitachi-hitec.com HTD-E249 2017.8
TM4000 Series The Future of Tabletop Microscopes is Here! The TM4000 0 0 Series features innovation on and cutting-edge g e technologies o e which h redefine e the capabilities a i of a tabletop top microscope. This new generation erati of the long-standing Hitachi i tabletop top microscopes s integrates ease of use, TM optimized i imaging, ing and high h image quality, while maintaining ing the compact c design of the well-established e l s e Hitachi i TM Series products. Experience e the new dimension of tabletop top microscopes s with the Hitachi i TM4000 0 0 and TM4000Plus. Easy and intuitive operation for data acquisition, reporting, and everything in between. Cutting-edge electron optics for high-image resolution and quality. Compact and efficient design allows installation almost anywhere.
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TM4000 Series TM4000Plus TM4000P us Highly versitile design The TM4000 Series gives users the freedom to optimize various operating conditions including beam condition (accelerating voltage), acquired electron signal type, magnification, and more. The TM4000Plus advances the EM field with the unmatched ability to observe SE,BSE, and mixed images under low vacuum conditions. The Superior High-Sensitivity Low-Vacuum SE Detector TM4000Plus The TM4000Plus equips the high-sensitivity low-vacuum SE detector. Therefore, an image of SE information is possible to obtain due to detecting the excited light. 5 kv Accelerating voltage 10 kv Accelerating voltage 15 kv Accelerating voltage Principle Primary electron beam OBJ. Lens Low-vacuum SE detector BSE Detector bias ele electrode Exciting light HV Gas molecules Positive Ion G as m i ficati on A mpl -e SE Copper crystals Magnification: 3,000x Image signal: Backscattered electron Magnification: 10,000x Magnetic head Magnification: 7,000x Rat bronchus Image signal: Backscattered electron Ball grid array (BGA) Magnification: 10,000x Magnification: 500x Image signal: Backscattered electron Magnification: 15,000x Mast cell BSE Sample Ceramic Magnification: 1,000x Powder medicine Magnification: 3,000x Factional film Detection Signals Magnification: 200x Resin foam Magnification: 10,000x Bacillariophyta Magnification: 25x Honey bee Accelerating Voltage The TM4000 Series features three beam conditions to chose from depending on the information desired from the sample. Differences in image appearance by changing accelerating voltage to 5 kv, 10 kv, and 15 kv are shown below." Accelerating Voltage 5 kv Resolution Low high Surface internal Low High Image information Backscattered electron signal 10 kv It is possible to observe multiple signals in TM4000 Series. Backscattered electron image (BSE) : Provides compositional information Secondary electron image (SE) : Provides surface rich information In typical instruments, the secondary electron image can only be acquired under high-vacuum conditions but with the TM4000Plus, the observation of SE information under low vacuum is easily achieved. BSE Backscattered electron (compositional information) Electron scattering area Pr imar y electr o n beam Secondary electron (surface morphology) S ample SE 15 kv Magnification: 500x 5 X -ra ys (element information used in EDS) Magnification: 500x Sticky notes 6
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