Advanced XRF Technology for Precision Plating Measurement

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Dora French
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1 Advanced XRF Technology for Precision Plating Measurement Plating Thickness Elemental Analysis Solution Analysis Superior Technically. Supported Locally.

Bowman XRF Technology is Widely Used Throughout Industry Fasteners PCBs,

Cr/Ni/Cu/ABS Zn/Fe Printed Circuit Boards Au/ENi/CuPCB (ENIG, ENEPIG)

Au/Ni/NiFe Fasteners ZnFe/Fe ZnNi/Fe Cutting Tools TiCN/WCo TiAlN/WC Hardware

NiP/Al Jewelry 10, 14, 18, 22Kt Elemental Analysis Alloy sorting Contaminant

2 Bowman XRF Technology is Widely Used Throughout Industry Fasteners PCBs, wafers, leadframes Cutting tools Automotive components Automotive Cr/Ni/Cu/ABS Zn/Fe Printed Circuit Boards Au/ENi/CuPCB (ENIG, ENEPIG) Immersion Ag or Sn/CuPCB LeadFrames and Connectors Au/Pd/Ni/Cu Alloys Au/Ni/NiFe Fasteners ZnFe/Fe ZnNi/Fe Cutting Tools TiCN/WCo TiAlN/WC Hardware and Plumbing Fixtures Ni/Cu Cr/Ni/Cu/Zn Telecommunications and Data Storage NiP/Al Jewelry 10, 14, 18, 22Kt Elemental Analysis Alloy sorting Contaminant ID Solution Analysis Plating bath Bowman instruments meet all applicable IPC specifications including 4552-A.

fittings H 1 Li 3 Na 11 K 19 Rb 37 Cs 55 Be 4 Mg 12 Ca 20 Sr 38 Ba 56 Unmatched Coating Thickness Range Bowman XRF

Ta 73 Al 13 Cr 24 Mo 42 W 74 Mn 25 Tc 43 Re 75 Fe 26 Ru 44 Os 76 92 U B 5 Al 13 C 6 Si 14 N 7 P 15 O 8 S 16 Co 27

Tl 81 Pb 82 Bi 83 84 Po F 9 Cl 17 Br 35 I 53 At 85 He 2 Ne 10 Ar 18 Kr 36 Xe 54 Rn 86 Fr 87 Ra 88 Rf 104 105 106

61 Pm 62 Sm 63 Eu 64 Gd 65 Tb 66 Dy 67 Ho 68 Er 69 Tm 70 Yb 71 Lu Ac 89 Th 90 Pa 91 U 92 Np 93 Pu 94 Am 95 Cm 96

3 Jewelry PCBs, connectors, wafers, etc. Plumbing fixtures High-temp/precision mechanical parts, memory devices Mechanical couplings, connector receivers, fittings H 1 Li 3 Na 11 K 19 Rb 37 Cs 55 Be 4 Mg 12 Ca 20 Sr 38 Ba 56 Unmatched Coating Thickness Range Bowman XRF Technology has a Precision Analysis Range from aluminum 13 to uranium 92 Sc 21 Y Ti Zr 40 Hf 72 V 23 Nb 41 Ta 73 Al 13 Cr 24 Mo 42 W 74 Mn 25 Tc 43 Re 75 Fe 26 Ru 44 Os U B 5 Al 13 C 6 Si 14 N 7 P 15 O 8 S 16 Co 27 Ni 28 Cu 29 Zn 30 Ga 31 Ge 32 As 33 Se 34 Rh 45 Pd 46 Ag 47 Cd 48 In 49 Sn 50 Sb 51 Te 52 Ir 77 Pt 78 Au 79 Hg 80 Tl 81 Pb 82 Bi Po F 9 Cl 17 Br 35 I 53 At 85 He 2 Ne 10 Ar 18 Kr 36 Xe 54 Rn 86 Fr 87 Ra 88 Rf Db Sg Bh Hs Mt 109 Ds 110 Rg 111 Cn 112 Nh 113 Fl 114 Mc 115 Lv 116 Ts 117 Og 118 La Ce 59 Pr 60 Nd 61 Pm 62 Sm 63 Eu 64 Gd 65 Tb 66 Dy 67 Ho 68 Er 69 Tm 70 Yb 71 Lu Ac 89 Th 90 Pa 91 U 92 Np 93 Pu 94 Am 95 Cm 96 Bk 97 Cf 98 Es 99 Fm 100 Md 101 No 102 Lr to 20 microns 0.01 to 30 microns 0.01 to 40~60 microns 0.01 to 70 microns to 110 microns 0.02 to 10 microns to 10 microns ask for details

4 State-of-the-art High Resolution Solid State Detector Well defined element peaks eliminates need for secondary filters. Minimal peak position drift provides high stability over time. Less frequent recalibration. Close-Coupled Geometry 3 times closer to sample than major competitors for increased precision and power efficiency. G Series P Series L Series Bowman has a chamber size for every application.

XRF Design Intuitive User Interface Simple design for daily testing functions Advanced functionality access to

automatically saved to PC database Data searchable by job query (Lot #, PO #, etc.

) Full software suite included standard Service-Friendly Design Quick plug-and-play access to the main

Ergonomic Work Station Basic front control panel Small footprint Lightweight One USB cable connection Colorful &

5 XRF Design Intuitive User Interface Simple design for daily testing functions Advanced functionality access to power users Password protection for all user levels Unlimited access for creating new applications All readings automatically saved to PC database Data searchable by job query (Lot #, PO #, etc.) Customizable one-click report generator Export report in several formats (PDF, CSV, etc.) Full software suite included standard Service-Friendly Design Quick plug-and-play access to the main measurement head for quick repair or replacement to minimize downtime. Ergonomic Work Station Basic front control panel Small footprint Lightweight One USB cable connection Colorful & informative data output display Customizable shortcut keys for quickly changing applications Familiar icon and tab-driven controls Custom report with stats and auto sample image capturing Wizard-based application setup menu

Advanced Thin Film Measurement Using µ-spot Poly Capillary Optics This

beam and a large window Silicon Drift Detector for unmatched speed,

Poly-capillary optics achieves greater than a hundred times higher

Small feature analysis with ultimate accuracy and precision in the

analysis µm Au µm Pd µm Ni µm NiP %P Ave 0.0427 0.08 3.71 10.2015 10.

0395 0.3863 0.99 The Bowman Optics Advantage %RSD 1.053% 1.121% 0.

6 Advanced Thin Film Measurement Using µ-spot Poly Capillary Optics This cutting edge XRF instrument features a small spot, high flux x-ray beam and a large window Silicon Drift Detector for unmatched speed, precision and performance. Poly-capillary optics achieves greater than a hundred times higher flux than a collimation system at the same distance from the source Small feature analysis with ultimate accuracy and precision in the shortest test time Designed for ENIG, ENEPIG and Electroless Nickel %P analysis µm Au µm Pd µm Ni µm NiP %P Ave StdDev Range The Bowman Optics Advantage %RSD 1.053% 1.121% 0.265% 1.067% 2.85% Micro View Macro View 2x Macro to 250x Micro - Dual camera single click to achieve 250x 3D Contour Map with Continuous Scanning

7 Configurations for every measurement requirement G SERIES Gold and precious metal analysis in the jewelry industry B SERIES Electroplated parts; an ideal entry level instrument for GMF P SERIES Coatings for electronics, semiconductor and general metal finishing, also gold and jewelry O SERIES Semiconductors and electronics M SERIES Semiconductors and electronics with small spot size requirements L SERIES Electroplated coatings on larger hardware, fasteners, bathroom fixtures G Series B Series P Series O Series M Series L Series Tube Micro-Focused X-ray Anode W W W/Mo/Rh Mo/Rh Mo/Rh W/Mo/Rh X-ray Path Bottom Up Top Down Top Down Top Down Top Down Top Down Detector Si PIN Detector Standard Standard Standard N/A N/A Standard Si Drift Detector Optional Optional Optional Standard Standard Optional Beam Size Single Collimator Standard Standard N/A N/A N/A N/A Multi-Collimators N/A Optional Standard N/A N/A N/A Capillary Optics FWHM N/A N/A N/A 80um 15um Optional Focal Depth Focus Laser Standard Standard Standard Standard Standard Standard Single Fixed Focal Depth Standard Standard N/A Standard Standard N/A Multi-Variable Focal Depths N/A Optional Standard N/A N/A Standard Video Magnification 20x Standard Standard Standard N/A N/A Standard 50x N/A Optional Optional Standard N/A Optional 250x Dual Macro Camera N/A N/A N/A Optional Standard Optional Stage & Chamber Dimensions Z Control Manual Automatic Automatic Automatic Automatic Automatic Z Travel N/A Base N/A Fixed Progammable Programmable Programmable Programmable Standard XY Travel N/A N/A 5x6 5x6 6.5x6.5 10x10 Optional XY Travel N/A N/A 10x10 10x10 N/A N/A Precision N/A N/A Chamber Dimensions HWD 5x15x12 5.5x12x13 5.5x12x13 5.5x12x13 5.4x12x13 11x22x24 Total Weight 25Kg 34kg 52-70kg 52-70kg 70kg 110kg Specifications subject to change

8 Superior technically. Supported locally. Bowman is a world-leading manufacturer of precision XRF coating measurement systems, with a robust local service network to support every system, at each customer location, worldwide. Our mission is to support you during every phase of your system s lifecycle from system evaluation, selection, and commissioning, through maintenance and modernization. Bowman service partners provide comprehensive, same-day service response for every need; we also work with customers to streamline their testing processes, and to generate the qualitative and quantitative information that's required, in less time. Our commitment: to deliver support solutions tailored to the needs and quality culture of each individual customer, so that, with each subsequent XRF system purchase, there is no question... that the system will be a Bowman. The Bowman Team: 30 Years of History, Innovation and Industry Recognition Improved plated thru hole measurement using patented micro-resistance probes Developed first slotted Coating Measurement XRF using PC detector First to introduce point and shoot positioning, with laser focus Improved the stability and extended the lifetime of micro spot X-ray tube Launched new product: Bowman Poly Capillary Optics XRF with Si Drift Detector Founded CMI International Introduced first handheld plated thru hole gauge using eddy current Launched first instrument operated by a stand-alone desktop computer Deployed Fundamental Parameters (FP) based coating measurement Launched new product: Bowman XRF with Si PIN detector NPI Award: Bowman µ-spot Poly Capillary Optics XRF with SDD for smaller spot sizes ANAB Certificate #L2213 Copyright 2017 Bowman Made in the USA Bowman 1125 Remington Rd. Schaumburg, IL sales@bowmanxrf.com XRF Equipment Local Tech Support, Worldwide Standards ISO/IEC Accredited Lab

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