STS Directory Accreditation number: STS 0009

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1 International standard: ISO/IEC 17025:2005 Swiss standard: SN EN ISO/IEC 17025:2005 Mettler-Toledo GmbH ENL Testing Laboratory Heuwinkelstrasse Naenikon SWITZERLAND Head: Bernhard Merk Responsible for MS: Michael Huber Telephone: mailto:bernhard.merk@mt.com Internet: Initial accreditation: Current accreditation: to Scope of accreditation see: (Accredited bodies) Scope of accreditation as of Testing laboratory for Electromagnetic Compatibility (EMC), Electrical Safety and Environmental Simulation Tests for Electronic Products and Scales Systems Products for information technology Safety regulations for electrical measuring, controlling, and laboratory equipment Electrical security Electrical safety tests Security requirements EN IEC General requirements EN IEC equipment for the heating of materials centrifuges EN IEC EN S) IEC S) / V hit/dil 0009stsvz engl 1/5

2 Paticular requirements for testing and measuring circuits EN IEC equipment for mixing and stirring Particular requirements for automatic and semi-automatic laboratory equipment for analysis and other purposes Particular requirements for in vitro diagnostic (IVD) medical equipment EN IEC EN IEC EN IEC Machines and electrical equipment of machines Particular requirements for control equipment EN IEC General safety regulations EN IEC Safety of machines Basic terminology, methodology ISO EN ISO installations Technical principles and specifications ISO EN ISO Principles for risk assessment ISO EN ISO Risk assessment and risk reduction EMC Emission, Basic standards ISO EN ISO Harmonics I 16A EN IEC Voltage fluctuations and flicker I 16A Disturbance voltages and currents f = MHz EN IEC EN CISPR / V hit/dil 0009stsvz engl 2/5

3 General Disturbance field strength f = MHz Distance R = 3m Test facility: FAR Disturbance field strength f = 1 6 GHz Distance R = 3m EMC Immunity, basic standards EN CISPR EN X) CISPR X) EN CISPR Electrostatic discharge (ESD) EN IEC Radio-frequency electromagnetic fields f = MHz Rapid electrical fast transients (burst) EN IEC EN EN Surge immunity EN IEC Conducted disturbances, induced by radio-frequency fields Magnetic fields with power frequencies Voltage dips, short interruptions, and voltage variations EMC of products Generic standards Product standards EN IEC EN IEC EN IEC EN IEC EN IEC EN IEC EN IEC EMC-testing according to product standards which are included completely by the generic standards above. Among others: / V hit/dil 0009stsvz engl 3/5

4 Non-automatic weighing instruments Industrial, scientific and medical (ISM) equipment Products for information technology Electrical equipment for process control and laboratory use Immunity Radio-frequency electromagnetic fields. Frequency range: f = MHz EN OIML R-76 Emission EN X) - Group 1 CISPR 11 A X) - Group 1 Emission EN X) CISPR 22 X) Emission and Immunity EN X) IEC X) Medical electrical equipment Collateral standard: EMC EN X) IEC X) Electrical equipment and installations Environment simulation Climate simulation Temperature: -60 C to +180 C EN IEC EN IEC EN IEC Humidity: 10 % - 95 % r. h. by temperature 5 C to 95 C EN IEC EN IEC Salt spray test ISO 9227 EN ISO 9227 EN IEC EN IEC MIL-Std. 810 Method 509 Determination of resistance to humidity - Part 2: Procedure for exposing test specimens in condensation water atmospheres IP test EN IEC EN ISO (former DIN humidity test) ISO / V hit/dil 0009stsvz engl 4/5

5 installations Mechanical stress Vibration EN IEC EN IEC Shock EN IEC Transportation tests EN MIL-Std. 810 Method 514 MIL-Std. 810 Method 516 ISTA 1A ISTA 2A ASTM D 5276 ASTM D 642 ASTM D 999 ASTM D 4728 Non-automatic weighting instruments Metrological aspects EN OIML R-76 Restrictions and remarks S) Exception: Protection against liberated gases, explosion and implosion and escape of microbiological materials X) Restriction: Radiated emissions with FAR, 3m measurement separation according to EN Abbreviation FAR Signification Fully Anechoic Room * / * / * / * / * / V hit/dil 0009stsvz engl 5/5