SCOPE OF ACCREDITATION TO ISO/IEC 17025:2005

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1 SCOPE OF ACCREDITATION TO ISO/IEC 17025:2005 SONY GLOBAL MANUFACTURING & OPERATIONS CORPORATION EMC/RF TEST LABORATORY - MAIN LAB 8-4 Shiomi Kisarazu-shi Chiba-ken, , Japan Mr. Koichi.Hiyaoka Phone: Koichi.Hiyaoka@sony.com ELECTRICAL (EMC) 1 Valid to: October 31, 2019 Certificate Number: In recognition of the successful completion of the A2LA accreditation is granted to this laboratory to perform the following electrical tests: Test Technology Test Method(s): 1 Emissions Radiated Emissions Up to 40 GHz 47 CFR, FCC Part 15 B (Using ANSI C63.4:2014); EN 55022; EN 55022:2006+A1:2007; EN 55022:2010; CISPR 22; AS/NZS CISPR 22; AS/NZS CISPR 22:2009 (Incorporating Amendment No 1); ICES-003; CISPR 13; EN 55013; EN 55013:2013; EN 55013:2001 (Incorporating Corrigendum No 1 and Amendments Nos 1 and 2); J55013; J55013(H22); CISPR 32; EN 55032; EN 55032:2015 (Excluding Table A.7); EN55032:2012; CISPR14-1; EN ; EN :2006+A1:2009+A2:2011 (Excluding Annex B); VCCI-CISPR 32:2016 (Excluding Table A.7); CISPRJ 32:2017 (Excluding Table A.7) Radiated Disturbance VCCI V-3 (up to 6 GHz) (Section 6.5) Conducted Emissions 47 CFR, FCC Part 15 B (Using ANSI C63.4:2014); EN 55022; EN 55022:2006+A1:2007; EN 55022:2010; CISPR 22; AS/NZS CISPR 22; AS/NZS CISPR 22:2009 (Incorporating Amendment No 1); ICES-003; CISPR 13; EN 55013; EN 55013:2013; EN 55013:2001 (Incorporating Corrigendum No 1 and Amendments Nos 1 and 2); J55013; J55013(H22); CISPR 32; EN 55032; EN 55032:2015; EN 55032:2012; CISPR14-1; EN ; EN :2006+A1:2009+A2:2011; VCCI-CISPR 32:2016; CISPRJ 32:2017; Conducted Disturbance VCCI V-3 (Section 6.3) (A2LA Cert. No ) Revised 06/05/2018 Page 1 of 4

2 Radio Communications (900MHz, 2.4GHz and 5 GHz) FCC 47, CFR Part 15C (using ANSI C63.10:2013); FCC 47, CFR Part 15E (using ANSI C63.10:2013); KDB ; KDB ; EN ; EN V1.9.1 ( ); EN ; EN V1.6.1 ( ); EN ; EN V2.2.1 ( ); EN ; EN V1.8.1 ( ); EN ; EN V1.6.1 ( ); EN V1.4.1 ( ); RSS-GEN; RSS-210; RSS-247 Cellular EN ; EN V1.3.1 ( ); EN ; EN V1.5.1 ( ) Wireless (RFID) (13.56 MHz) FCC 47 CFR Part 15C (using ANSI C63.10:2013); EN ; EN V1.8.1 ( ); EN V1.6.1 ( ); EN ; EN V1.6.1 ( ); RSS-GEN; RSS-210 GPS EN ; EN V1.6.1 ( ); EN V1.4.1 ( ); EN ; EN ; EN V1.6.1 ( ) Canadian Broadcasting Standard BETS-7 (Section 4.1) Immunity Current Harmonics IEC ; IEC :2005+A1:2008+A2:2009; EN ; EN :2014; EN :2006+A1:2009+A2:2009; EN :2006+A2:2009 Voltage Fluctuations and Flicker IEC ; EN ; EN :2008; EN :2013; EN :1995+A1:2001 Electrostatic Discharge IEC ; EN ; EN :2009; EN :1995+A1:1998+A2:2001; JIS C Radiated Immunity IEC ; EN ; EN :2006+A1:2008+A2:2010; JIS C Electrical Fast Transient/Burst IEC ; EN ; EN :2012; EN :2004; EN :2004+A1:2010; JIS C (A2LA Cert. No ) Revised 06/05/2018 Page 2 of 4

3 Immunity (cont.) Surge Immunity IEC ; IEC :2005; EN ; EN :2014; EN :2006; JIS C Conducted Immunity IEC ; IEC :2003+A1:2004+A2:2006; EN ; EN :2014; EN :2009; EN :2007; JIS C ; JIS C :2006 Power Frequency Magnetic Field IEC ; EN ; EN :2010; EN :1993+A1:2001; JIS C Voltage Dips and Interruptions IEC ; EN ; EN :2004; JIS C Specific Absorption Rate (SAR) FCC OET No. 65, Supplement C; FCC 47 CFR, Part ; IEEE 1528:2013; KDB ; KDB ; RSS 102; EN 50360; EN 50360:2001+A1:2012; EN 50566; EN 50566:2013; EN ; IEC ; EN :2006; EN :2016; EN ; IEC ; EN :2010; EN 62311; EN 62311:2008; Article 14-2 of the Ordinance Regulating Radio Equipment; Radiocommunications (Electromagnetic Radiation Human Exposure) Standard Generic and Product Family Standards CISPR 24; EN 55024; EN 55024:2010; CISPR 20; EN 55020; EN 55020:2007+A11:2011; CISPR 11 (Group 1); CISPR 11:2009+A1:2010 (Group 1); EN (Group 1); EN 55011:2009+A1:2010 (Group 1); EN 55011:2007 (Group 1); CISPR14-2; EN ; EN :1997+A1:2001+A2:2008; IEC ; EN ; EN :2007; IEC ; EN ; EN :2007+A1:2011 Medical IEC Ed. 4:2014 (except home healthcare environment and special environment); IEC Ed. 3:2007 (except life-supporting equipment, EN Ed. 4:2015 (except home healthcare environment and special environment); EN :2007 (except life-supporting equipment, JIS T :2012 (except life-supporting equipment, IEC :2009 (Clause 202); IEC :2007 (Clause 202.6) Automotive 2 RF Conducted Emissions CISPR 25 (Section 6.3); CISPR 25 Ed.4:2016 (Section 6.3); CISPR 25 Ed. 2:2002, Ed. 3:2008 (Section 6.2) (LV components only) (A2LA Cert. No ) Revised 06/05/2018 Page 3 of 4

4 Automotive 2 (cont.) RF Radiated Emissions CISPR 25 (Section 6.5); CISPR 25 Ed. 4:2016 (Section 6.5); CISPR 25 Ed. 2:2002, Ed. 3:2008 (Section 6.4) (LV components only) Electrical Transient Conducted Emissions Electrical Transient Conducted Immunity ISO (Section 4.3); ISO Ed. 2:2004, Ed. 3:2011 (Section 4.3) ISO (Section 4.4); ISO Ed. 2:2004, Ed. 3:2011 (Section 4.4) 1 For standards or methods listed on the scope of accreditation without a revision date, laboratories are expected to be competent in the use of the current version within one year of the date of publication of the standard test method or upon the date specified by the standard test method originator when the originator has implementation authority. When a superseded standard or method is required for an accredited test, the scope will include the superseded date/version. 2 The tests include all relevant pre-compliance measurements in context of a homologation testing in accordance to the automotive standards of UN-ECE R10 Rev.5; Rev. 4 (e/e) Regulation or the EMC directive. Testing Activities Performed in Support of FCC Declaration of Conformity and Certification in Accordance with 47 Code of Federal Regulations and FCC KDB , Appendix A, Table A.1 3 : Rule Subpart/Technology Test Method Maximum Frequency Unintentional Radiators Part 15B ANSI C63.4: GHz Intentional Radiators Part 15C ANSI C63.10: GHz U-NIII without DFS Intentional Radiators Part 15E ANSI C63.10: GHz RF Exposure Devices Subject to SAR Requirements IEEE Std 1528:2013 6GHz 3 Accreditation does not imply acceptance to the FCC equipment authorization program. Please see the FCC website ( for a listing of FCC approved laboratories. (A2LA Cert. No ) Revised 06/05/2018 Page 4 of 4

5 Accredited Laboratory A2LA has accredited SONY GLOBAL MANUFACTURING & OPERATIONS CORPORATION EMC/RF TEST LABORATORY - MAIN LAB Chiba-ken, Japan for technical competence in the field of Electrical Testing This laboratory is accredited in accordance with the recognized International Standard ISO/IEC 17025:2005 General requirements for the competence of testing and calibration laboratories. This accreditation demonstrates technical competence for a defined scope and the operation of a laboratory quality management system (refer to joint ISO-ILAC-IAF Communiqué dated 8 January 2009). Presented this 9 th day of October President and CEO For the Accreditation Council Certificate Number Valid to October 31, 2019 For the tests to which this accreditation applies, please refer to the laboratory s Electrical Scope of Accreditation.

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